2134/33596
Simon Wang
Simon
Wang
Christopher Harvey
Christopher
Harvey
Bo Yuan
Bo
Yuan
Gary Critchlow
Gary
Critchlow
Rachel Thomson
Rachel
Thomson
Thin film properties by blister tests
Loughborough University
2018
Telephone cord blisters
Pockets of energy concentration
Residual stress
Interface adhesion toughness
Spallation
Materials Engineering not elsewhere classified
2018-06-28 10:34:23
Conference contribution
https://repository.lboro.ac.uk/articles/conference_contribution/Thin_film_properties_by_blister_tests/9222995
With the measured geometry morphologies of telephone cord blisters (TCBs), that is, the local blister width and height, and the global wavelength, a mechanical model is built to determine the residual compressive stress in thin films and interface adhesion toughness. This model is based on the hypothesis that pockets of energy concentration (PECs) drive the nucleation and growth of TCBs in thin films under the constant residual stress. The model is validated with independent experimental measurements and shows the strong potential to guide the fabrication of micro-patterns on thin films.