HQASEM-644-ANALYSIS OF KEY PERFORMANCE PARAMETER EXTRACTION FROM I-V MEASUREMENTS OF PV DEVICES.pdf (395.09 kB)
Analysis of key performance parameter extraction from current voltage measurements of photovoltaic devices
conference contribution
posted on 2011-06-10, 13:34 authored by Hassan Qasem, Tom BettsTom Betts, Ira D. Sara, Martin BlissMartin Bliss, Jiang Zhu, Ralph GottschalgThe accuracy of the characterisation of photovoltaic
devices may be affected by the method of extraction
of the performance parameters. This paper
investigates potential uncertainties in extracted short
circuit current (Isc), open circuit voltage (Voc) and
maximum power (Pmpp) from current-voltage (I-V)
data of a photovoltaic (PV) device. Different
interpolation methods are compared. Linear
interpolation, straight line regression and polynomial
regression methods are compared in different
scenarios in which the curve point density and point
selection for extraction are varied. The comparison
shows that regression approaches can produce
more accurate results when appropriate curve point
density and point selection are selected. When
attempting to extract Isc. Voc and Pmpp from noisy or
irregular I-V data, linear interpolation is less robust
than regression because of the irregular point
distribution on the I-V curve.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Research Unit
- Centre for Renewable Energy Systems Technology (CREST)
Citation
QASEM, H. ... et al, 2011. Analysis of key performance parameter extraction from current voltage measurements of photovoltaic devices. IN: Proceedings of 37th IEEE Photovoltaic Specialist Conference (PVSC), Seattle, USA, 19th-24th June.Publisher
© IEEEVersion
- AM (Accepted Manuscript)
Publication date
2011Notes
This conference paper [© IEEE] is also available at: http://www.ieee.org/conferences_events/. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.Publisher version
Book series
Proceeding number;644Language
- en
Administrator link
Usage metrics
Categories
No categories selectedKeywords
Licence
Exports
RefWorks
BibTeX
Ref. manager
Endnote
DataCite
NLM
DC