Extraction of displacement data from Electronic Speckle Pattern Interferometric fringe patterns using digital image processing techniques

2018-01-19T15:29:43Z (GMT) by David Kerr
The commercial exploitation of Electronic Speckle Pattern Interferometry (ESPI) is now gathering pace with manufacturers marketing products in Europe and the USA. The power of the technique both in a research and an industrial inspection role has brought pressure from the engineering community for an automated fringe analysis system. [Continues.]