Localization of abnormal EEG sources using blind source.pdf (284.4 kB)
Localization of abnormal EEG sources using blind source separation partially constrained by the locations of known sources
journal contribution
posted on 2009-12-04, 14:43 authored by Mohamed Amin Latif, Saeid Sanei, Jonathon Chambers, Leor ShokerElectroencephalogram (EEG) source localization
requires a solution to an ill-posed inverse problem. The additional
challenge is to solve this problem in the context of multiple moving
sources. An effective and simple technique for both separation
and localization of EEG sources is therefore proposed by incorporating
an algorithmically coupled blind source separation (BSS)
approach. The method relies upon having a priori knowledge of the
locations of a subset of the sources. The cost function of the BSS
algorithm is constrained by this information, and the unknown
sources are iteratively calculated. An important application of this
method is to localize abnormal sources, which, for example, cause
changes in attention, movement, and behavior. In this application,
the Alpha rhythm was considered as the known sources. Simulation
studies are presented to support the potential of the approach
in terms of source localization.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Citation
LATIF, M.A. ...et al, 2006. Localization of abnormal EEG sources using blind source separation partially constrained by the locations of known sources. IEEE Signal Processing Letters, 13 (3), pp. 117-120.Publisher
© IEEEVersion
- VoR (Version of Record)
Publication date
2006Notes
This article was published in the journal IEEE Signal Processing Letters [© IEEE] and is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISSN
1070-9908Language
- en