Modelling spectroscopic performance of pixelated semiconductor detectors through Monte-Carlo simulation
When choosing or designing a detector for a particular application, a complete understanding of the expected response is vital. Parameters such as quantum efficiency, spatial resolution, signal-to-noise ratio, count rate capability and spectral resolution all play a part in the suitability of a detector. These parameters are not necessarily independent, and in many cases an improvement in one parameter can only be achieved with deterioration of another.
Published inAdvanced X-ray Detector Technologies: Design and Applications
Pages59 - 85
- AM (Accepted Manuscript)
Rights holder© Springer Nature Switzerland AG
Publisher statementThis book chapter was accepted for publication in the book Advanced X-ray Detector Technologies: Design and Applications [© Springer Nature Switzerland AG]. The published version is available at https://doi.org/10.1007/978-3-030-64279-2_3
ISBN9783030642785; 9783030642792; 9783030642815