DC magnetism of Niobium thin films
conference contributionposted on 18.08.2017 by Stuart Wilde, O.B. Malyshev, Reza Valizadeh, G.B.G. Stenning, T. Sian, A. Hannah, Boris Chesca
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Niobium thin films were deposited onto a-plane sapphire with varying kinetic energy and varying substrate temperature. There were no consistent trends which related the particle energy or substrate temperature to RRR. The sample which displayed the largest RRR of 229 was then compared to both a thin film deposited with similar conditions onto copper substrate and to bulk niobium. DC magnetometry measurements suggest that the mechanism of flux entry into thin film niobium and bulk niobium may vary due to differences in the volumes of both defects and impurities located within the grains. Results also suggest that magnetic flux may penetrate thin films at small fields due to the sample geometry.