Quantifying minority carrier lifetime and collection efficiency of solar cells by combined optical and electrical characterisation techniques
conference contributionposted on 30.10.2018 by Vincent Tsai, C. Potamialis, Sona Ulicna, Martin Bliss, Tom Betts, Ralph Gottschalg
Any type of content contributed to an academic conference, such as papers, presentations, lectures or proceedings.
This work presents the use of a combined measurement system for spectrally-resolved photoluminescence (PL), time-resolved photoluminescence (TRPL) and transient photocurrent decay (TPCD) to characterise the physical properties of solar cells and their materials. A physical model is proposed to quantify the localised carrier collection efficiency of solar cells from the measured localised minority carrier lifetime from TRPL measurements and the localised minority carrier diffusion time from TPCD measurements. A single excitation laser source is used to measure TRPL and TPCD at the same spot on the solar cell. Combined PL, TRPL and TPCD measurements are conducted on a CdS/CdTe and a CIGS sample. The resulting PL spectra for both samples show that the emission spectra can yield information on the material bandgap. TRPL and TPCD yield localised carrier lifetime and diffusion times of τTRPL=3.91ns and τTPCD=40.5ns respectively for the CdS/CdTe sample, and τTRPL=2.45ns and τTPCD=196.8ns respectively for the CIGS sample. The ratio between the τTRPL and τTPCD values is shown to be proportional to the localised carrier collection efficiency, yielding collection efficiencies of 21.97% and 7.93% for the CdS/CdTe and CIGS sample, respectively. The initial results show that the localised carrier collection efficiency may be affected by the sample’s metal contact configuration. In short, this combined measurement approach can offer a novel and useful method of characterising the material quality of solar cells and the localised carrier collection efficiency of finished PV devices.
- Mechanical, Electrical and Manufacturing Engineering