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Reliability modelling for systems with stress related dependencies

conference contribution
posted on 18.11.2008 by J.D. Andrews, H. Sun
Many of the more efficient systems reliability modelling methods require the components which comprise the system to fail independently. When this condition is true fault trees can be developed for the system failure model and the analysis can be performed taking advantage of the binary decision diagram (BDD) technique. The advantages of such an approach are well documented. When dependencies exist techniques such as simulation or Markov methods can be employed with the associated demands on computational resources. Many system features can give rise to dependencies. One such situation is where a stress-related dependency is encountered. In this case the system has a parallel structure and failures of the parallel streams place higher stresses (with increased failure rate) on those streams still functioning. This paper describes an approach for modelling systems with stress related dependencies. It utilises the BDD method to retain efficiency and forms appropriate integrals to yield the failure probability of each failure mode. An example of where this approach can be applied is used to demonstrate the methodology.

History

School

  • Aeronautical, Automotive, Chemical and Materials Engineering

Department

  • Aeronautical and Automotive Engineering

Citation

ANDREWS, J.D. and SUN, H., 2007. Reliability modelling for systems with stress related dependencies. IN: Aven, T. and Vinnem, J.E. (eds.). Risk, Reliability and Societal Safety: Proceedings of the European Safety and Reliability Conference 2007 (ESREL 2007), Stavanger, Norway, 25-27 June, pp. 987-993

Publisher

© Taylor & Francis

Version

NA (Not Applicable or Unknown)

Publication date

2007

Notes

This conference paper is Restricted Access. It is available from: http://www.taylorandfrancis.com/

ISBN

9780415447867;0415447860

Language

en

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