Review of uncertainty sources in indoor PV calibration of c-SI, and thin film single junction and multi junction cells and modules
conference contributionposted on 16.09.2014 by Blagovest Mihaylov, Martin Bliss, Tom Betts, Ralph Gottschalg
Any type of content contributed to an academic conference, such as papers, presentations, lectures or proceedings.
The calibration of PV devices requires an uncertainty analysis. However, the benefits of such analysis are not limited to calibration procedures. It can be useful for all PV device measurements since it increases the validity of the results. The sources of uncertainty in indoor PV device calibration are outlined. The uncertainties are discussed for different measurement setups and technologies. Indoor secondary calibration uncertainty in Pmax can range from less than 1.5% for c-Si cells to more than 10% for large TF modules. The paper highlights the importance of understanding the uncertainty sources and conducting specific uncertainty calculations for a given measurement setup. The implications for research laboratories are that excessively large uncertainty in measurements can make comparison between results misleading and the conclusions questionable.
- Mechanical, Electrical and Manufacturing Engineering
- Centre for Renewable Energy Systems Technology (CREST)