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Robust intelligent metrology

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conference contribution
posted on 14.08.2014 by Jon Petzing, Mitul Tailor, Peter Kinnell
Robust Intelligent Metrology considers how to maintain, develop, streamline and apply core metrological principles within rapidly evolving measurement scenarios and environments. The aim is to deliver metrology laboratory quality measurements and data confidence, but with equipment integrated into operating High Value Manufacturing cells. Key challenges are to understand; transducer / surface interactions, data processing and integrity, in-cell calibration / traceability. The end result is to provide engineers with quicker, better data.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

Royal Academy of Engineering Soiree and Exhibition RAE Summer Soiree and Exhibition: Manufacturing - at the heart of the nation

Pages

21 - 21 (1)

Citation

PETZING, J.N., TAILOR, M. and KINNELL, P., 2014. Robust intelligent metrology. IN: Williams, R (ed). Royal Academy of Engineering Soiree and Exhibition 2014: Manufacturing - at the heart of the nation, 19th June 2014, The MTC, Coventry, pp.21.

Publisher

Royal Academy of Engineering

Version

AM (Accepted Manuscript)

Publication date

2014

Notes

This is a conference contribution.

Language

en

Location

The MTC, Coventry, UK

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