Robust intelligent metrology
conference contributionposted on 14.08.2014 by Jon Petzing, Mitul Tailor, Peter Kinnell
Any type of content contributed to an academic conference, such as papers, presentations, lectures or proceedings.
Robust Intelligent Metrology considers how to maintain, develop, streamline and apply core metrological principles within rapidly evolving measurement scenarios and environments. The aim is to deliver metrology laboratory quality measurements and data confidence, but with equipment integrated into operating High Value Manufacturing cells. Key challenges are to understand; transducer / surface interactions, data processing and integrity, in-cell calibration / traceability. The end result is to provide engineers with quicker, better data.
- Mechanical, Electrical and Manufacturing Engineering