Tomographic imaging of all orthogonal components of the displacement field in weakly scattering materials using wavelength scanning interferometry
conference contributionposted on 28.01.2014 by Pablo Ruiz, Semanti Chakraborty
Any type of content contributed to an academic conference, such as papers, presentations, lectures or proceedings.
This paper presents a wavelength scanning interferometry system which provides displacement fields inside the volume of semi-transparent scattering materials with high spatial resolution and threedimensional displacement sensitivity. This technique can be viewed as frequency multiplexed sweptsource OCT in which different channels carry information for specific displacement sensitivities.
- Mechanical, Electrical and Manufacturing Engineering