Huntley_1033204-1.pdf (638.09 kB)
Download file

Accurate characterisation of hole geometries by fringe projection profilometry

Download (638.09 kB)
conference contribution
posted on 08.08.2017, 10:24 by Yuxiang Wu, Harshana Dantanarayana, Huimin Yue, Jonathan Huntley
Accurate localisation and characterisation of holes is often required in the field of automated assembly and quality control. Compared to time consuming coordinate measuring machines (CMM), fringe-projection-based 3D scanners offer an attractive alternative as a fast, non-contact measurement technique that provides a dense 3D point cloud of a large sample in a few seconds. However, as we show in this paper, measurement artefacts occur at such hole edges, which can introduce errors in the estimated hole diameter by well over 0.25 mm, even though the estimated hole centre locations are largely unaffected. A compensation technique to suppress these measurement artefacts has been developed, by modelling the artefact using data extrapolated from neighboring pixels. By further incorporating a sub-pixel edge detection technique, we have been able to reduce the root mean square (RMS) diameter errors by up to 9.3 times using the proposed combined method.


This work was supported by the Engineering and Physical Sciences Research Council under the Light Controlled Factory project EP/K018124/1.



  • Mechanical, Electrical and Manufacturing Engineering

Published in

Videometrics, Range Imaging, and Applications XIV




WU, Y. al., 2017. Accurate characterisation of hole geometries by fringe projection profilometry. Proc. SPIE 10332, Videometrics, Range Imaging, and Applications XIV, 1033204 (June 26, 2017); doi:10.1117/12.2270210.




VoR (Version of Record)

Acceptance date


Publication date



Copyright 2017 Society of Photo-Optical Instrumentation Engineers. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.

Book series

Proceedings of SPIE;10332




Munich, Germany