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Alternative color filter array layouts for digital photography

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conference contribution
posted on 05.05.2010, 08:49 by Konstantin Gorokhovskiy, James FlintJames Flint, S. Datta
The performance of digital cameras depends not only on the accuracy of methods of restoration of missed color samples (demosaicking) for a given color filter array, but also from spatial configuration of color sensors in the color filter array (CFA) itself. This paper considers three different color filter array (CFA) patterns; the established (2 by 2) Bayer pattern, the 3 by 2 (6-sample) and the 3 by 3 diagonal Bayer CFA. One difficulty in comparing the different schemes is the influence of the demosaicking algorithm on the result. In order to remove this dependence we propose three methods of comparison. They are: (a) measuring widowed averages of colors on large areas (b) visual comparison of interference between regular patterns of images and CFA, and (c) utilization of one layer neural networks to build demosaicking algorithm for selected color filter arrays. A substantial image database comprising 1338 images has been used to experimentally validate the different patterns.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Citation

GOROKHOVSKIY, K., FLINT, J.A. and DATTA, S., 2006. Alternative color filter array layouts for digital photography. IN: Malcovati, P. and Baschirotto, A. (eds.). 2nd Conference on Ph.D. Research in Microelectronics and Electronics, Otranto (Lecce), Italy, June 12-15, 2006, Proceedings, pp. 265-268.

Publisher

© IEEE

Version

VoR (Version of Record)

Publication date

2006

Notes

This is a conference paper [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

ISBN

1424401577

Language

en