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Characterization and modelling of Ni based superalloy materials with a dual layered MCrAlY coating system

conference contribution
posted on 2014-03-14, 14:06 authored by Y. Liu, Mudith Karunaratne, Mark JepsonMark Jepson, Rachel ThomsonRachel Thomson
Multilayered MCrAlY type coatings have the potential to be optimised to protect superalloy components against both corrosion and oxidation simultaneously. In this paper, a dual layered coating (NiCrAlY on top of a CoNiCrAlY coating) has been aged and the microstructural evolution has been observed and quantified using various electron microscopy based techniques. In addition, the microstructural evolution of the coating has been modelled using a diffusion based model capable of modelling the ageing of multilayer coatings. It is demonstrated that the model is reasonably accurate in predicting both the phase and chemical distributions through the coating system during ageing, and therefore has the potential to be used as a design tool for the improvement of future layered coating systems.


We would like to acknowledge the support of The Energy Programme, which is a Research Councils UK cross council initiative led by EPSRC and contributed to by ESRC, NERC, BBSRC and STFC, and specifically the Supergen initiative (Grants GR/S86334/01 and EP/F029748) and the following companies; Alstom Power Ltd., E.ON, Doosan Babcock, National Physical Laboratory, Praxair Surface Technologies, QinetiQ, Rolls-Royce plc, RWE npower, Siemens Industrial Turbomachinery Ltd. and Tata Steel for their valuable contributions to the project.



  • Aeronautical, Automotive, Chemical and Materials Engineering


  • Materials


LIU, Y. ... et al, 2012. Characterization and modelling of Ni based superalloy materials with a dual layered MCrAlY coating system. IN: Huron, E.S. et al (eds). Superalloys 2012: 12th International Symposium on Superalloys, Seven Springs, PA. John Wiley and sons, pp. 795 - 802.


© John Wiley and sons


  • AM (Accepted Manuscript)

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  • en


Huron, E.S.;Reed, R.C.;Hardy, M.C.;Mills, M.J.;Montero, R.E.;Portella, P.D.;Telesman, J.