posted on 2017-08-18, 08:29authored byStuart Wilde, O.B. Malyshev, Reza Valizadeh, G.B.G. Stenning, T. Sian, A. Hannah, Boris Chesca
Niobium thin films were deposited onto a-plane sapphire with varying kinetic energy and varying substrate temperature. There were no consistent trends which related the particle energy or substrate temperature to RRR. The sample which displayed the largest RRR of 229 was then compared to both a thin film deposited with similar conditions onto copper substrate and to bulk niobium. DC magnetometry measurements suggest that the mechanism of flux entry into thin film niobium and bulk niobium may vary due to differences in the volumes of both defects and impurities located within the grains. Results also suggest that magnetic flux may penetrate thin films at small fields due to the sample geometry.
History
School
Science
Department
Physics
Published in
18th International Conference on RF Superconductivity
Citation
WILDE, S. ...et al., 2017. DC magnetism of Niobium thin films. Presented at the 18th International Conference on RF Superconductivity, Lanzhou, China, 17-21st July.
Publisher
JACoW
Version
AM (Accepted Manuscript)
Publisher statement
This work is made available according to the conditions of the Creative Commons Attribution 3.0 Unported (CC BY 3.0) licence. Full details of this licence are available at: http://creativecommons.org/licenses/by/3.0/
Acceptance date
2017-07-17
Publication date
2017
Notes
This is an Open Access Article. It is published by JacoW under the Creative Commons Attribution 3.0 Unported Licence (CC BY). Full details of this licence are available at: http://creativecommons.org/licenses/by/3.0/