Degradation of power output of photovoltaic modules due to accelerated ageing

This research work focusses on a type of indoor accelerated stress test (AST) which is an extension of the damp-heat (DH) test proposed by the international electrotechnical commission in IEC-61215-2, to reproduce the field failures by applying environmental stresses (temperature (T), relative humidity (RH)) to photovoltaic (PV) mini-modules as well as to compare whether the calculated activation energy associated with such degradation modes is consistent with the range of values reported in literature. In addition, the effect of curing time during PV module lamination on the durability of the PV-modules will be evaluated for crystalline silicon (c-Si) PV mini-modules produced from the same materials.