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Evaluation of effective carrier lifetime of CdTe solar cells using transient photovoltage decay measurements

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conference contribution
posted on 09.06.2017, 15:43 by Vincent Tsai, George Koutsourakis, Martin BlissMartin Bliss, Tom BettsTom Betts, Ralph Gottschalg
A transient photovoltage decay (TPVD) measurement system is currently being developed at CREST and measurements were conducted on several CdTe solar cells. The extracted effective carrier lifetimes were around 100ns. The effect of external illumination biasing was investigated and was found to reduce the effect of junction capacitance and saturate trap states in the devices. This resulted in shorter extracted effective carrier lifetimes. Increasing the illumination of the pulsed-laser intensity also increased the effective carrier lifetime.

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School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

13th Photovoltaic Science, Application and Technology Conference

Citation

TSAI, V. ... et al, 2017. Evaluation of effective carrier lifetime of CdTe solar cells using transient photovoltage decay measurements. 13th Photovoltaic Science, Application and Technology Conference (PVSAT-13), Bangor, UK, 5th-7th April 2017.

Publisher

© The Solar Energy Society

Version

AM (Accepted Manuscript)

Publisher statement

This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/

Acceptance date

05/04/2017

Publication date

2017

Notes

This is a conference paper.

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Language

en

Location

Bangor

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