PVSC43_Thomas_Fiducia.pdf (2.67 MB)
Download fileIntragranular defects in As-deposited and Cadmium Chloride treated Polycrystalline Cadmium Telluride solar cells
conference contribution
posted on 2016-11-04, 13:19 authored by Tom Fiducia, Ali Abbas, Kurt L. Barth, Walajabad S. Sampath, Michael WallsMichael WallsAtomic-scale defects limit the open circuit Voltage, and the conversion efficiency of thin film polycrystalline cadmium telluride solar cells. Using state of the art aberration corrected high resolution transmission electron microscopy, the type, density and atomic structure of intragranular defects present in cadmium chloride treated and untreated CdTe has
been established. The cadmium chloride activation process dramatically reduces defect density but faults do remain. Characterizing the defects in both materials is an essential first step to determining their potential electrical effects, and to
understanding how the cadmium chloride treatment reduces their density. Improving our knowledge of the mechanisms involved can lead to further process improvements.
Funding
This work was funded by the UKERC Supergen SuperSolar Hub .
History
School
- Mechanical, Electrical and Manufacturing Engineering
Published in
43rd IEEE Photovoltaics Specialist Conference (PVSC)Pages
3366 - 3390 (5)Citation
FIDUCIA, T. ...et al., 2016. Intragranular defects in As-deposited and Cadmium Chloride treated Polycrystalline Cadmium Telluride solar cells. Presented at the 43rd IEEE Photovoltaics Specialist Conference, Portland, OR, 5-10th June, pp. 3366-3390.Publisher
© IEEEVersion
- AM (Accepted Manuscript)
Acceptance date
2016-10-10Publication date
2016Notes
© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.ISBN
9781509027248Publisher version
Language
- en