ES06.pdf (354.45 kB)
Download file

Large area LBIC measurement system for thin film photovoltaic modules

Download (354.45 kB)
conference contribution
posted on 10.08.2009, 11:34 by Pongpan Vorasayan, Martin Bliss, Thomas R. Betts, Ralph Gottschalg, A.N. Tiwari
A laser beam induced current system has been developed for large area thin film technology. Employing a non-destructive laser scanning approach, such a system is used as a characterisation tool that is able to perform local performance investigation and allows efficient defect detection in large scale devices. In this paper, the results are shown for large area single junction amorphous silicon modules. The scanning images reveal an inhomogeneous current signal. Cross-section analysis illustrates that in some modules, there is considerable performance variation between cells. Certain cells are nearly or completely inactive. Interconnection problems, tiny cracks and defects that cannot be detected by visual inspection can also be identified.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Research Unit

  • Centre for Renewable Energy Systems Technology (CREST)

Citation

VORASAYAN, P. ... et al, 2006. Large area LBIC measurement system for thin film photovoltaic modules. IN: Eurosun 2006 Conference Proceedings, Glasgow Caledonian University, Scotland.

Publisher

© Solar Energy Society (UK-ISES) / © The authors

Version

AM (Accepted Manuscript)

Publication date

2006

Notes

This is a conference paper. Further details of the conference are available at: http://www.eurosun2006.org/

ISBN

0904963731

Language

en

Usage metrics

Categories

Exports