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Large area LBIC measurement system for thin film photovoltaic modules
conference contribution
posted on 2009-08-10, 11:34 authored by Pongpan Vorasayan, Martin Bliss, Thomas R. Betts, Ralph Gottschalg, A.N. TiwariA laser beam induced current system has been developed for large area thin film technology. Employing a non-destructive laser scanning approach, such a system is used as a characterisation tool that is able to perform local performance investigation and allows efficient defect detection in large scale devices. In this paper, the results are shown for large area single junction amorphous silicon modules. The scanning images reveal an inhomogeneous current signal. Cross-section analysis illustrates that in some modules, there is considerable performance variation between cells. Certain cells are nearly or completely inactive. Interconnection problems, tiny cracks and defects that cannot be detected by visual inspection can also be identified.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Research Unit
- Centre for Renewable Energy Systems Technology (CREST)
Citation
VORASAYAN, P. ... et al, 2006. Large area LBIC measurement system for thin film photovoltaic modules. IN: Eurosun 2006 Conference Proceedings, Glasgow Caledonian University, Scotland.Publisher
© Solar Energy Society (UK-ISES) / © The authorsVersion
- AM (Accepted Manuscript)
Publication date
2006Notes
This is a conference paper. Further details of the conference are available at: http://www.eurosun2006.org/ISBN
0904963731Language
- en