IEEE paper 2016 - formatting corrections.pdf (443.97 kB)
Download fileOptimising I-V measurements of high capacitance modules using dark impedance measurements
conference contribution
posted on 2017-02-09, 11:35 authored by Alex Eeles, Ralph Gottschalg, Tom BettsTom BettsA method is demonstrated to optimise pulsed IV measurements of high capacitance PV modules, using dark IV and impedance measurements. The impact of capacitance during I-V measurements is minimised by changing the shape of the voltage ramp. The optimisation can be performed simply and automatically for each individual module during the charging period for the simulator. As an additional benefit of this method the extracted C-V profile can be used to estimate the minority carrier lifetime for the module. The system is demonstrated by using a high capacitance n type module, which is successfully measured in a single 10ms illumination pulse.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Published in
IEEE Photovoltaic Specialists Conference Conference Record of the IEEE Photovoltaic Specialists ConferenceVolume
2016-NovemberPages
3693 - 3697Citation
EELES, A., GOTTSCHALG, R. and BETTS, T.R., 2016. Optimising I-V measurements of high capacitance modules using dark impedance measurements. Presented at the IEEE 43rd Photovoltaic Specialists Conference (PVSC), Portland, OR, USA, 5th-10th June 2016, pp. 3693-3697.Publisher
© IEEEVersion
- AM (Accepted Manuscript)
Acceptance date
2016-08-19Publication date
2016Notes
© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.ISBN
9781509056057ISSN
0160-8371Publisher version
Language
- en