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Performance measurements at varying irradiance spectrum, intensity and module temperature of amorphous silicon solar cells

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conference contribution
posted on 03.02.2011, 11:14 by Martin Bliss, Tom Betts, Ralph Gottschalg
This paper demonstrates photovoltaic (PV) device performance measurements for energy rating and energy yield calculation derived indoors with an LED-based solar simulator prototype under varying irradiance (G), temperature (T) and spectrum (E), opening the possibility for much faster and more accurate energy yield prediction than previously possible from measurements acquired either indoors or outdoors, with the additional inclusion of spectral influences. The main aspects of the LED-based solar simulator used are described briefly and the measurement method with its requirements is explained in detail. Also presented are the first performance measurements made with an amorphous silicon solar cell; measuring the spectral effects reported in outdoor measurements for the first time in the laboratory. Results show a good agreement with previously reported spectral effects from outdoor measurements and underline the importance to consider all three environmental vectors (irradiance, spectrum and device temperature) for energy yield focused measurements.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Research Unit

  • Centre for Renewable Energy Systems Technology (CREST)

Citation

BLISS, M., BETTS, T.R. and GOTTSCHALG, R., 2010. Performance measurements at varying irradiance spectrum, intensity and module temperature of amorphous silicon solar cells. IN: 35th IEEE Photovoltaic Specialists Conference (PVSC), Honolulu, HI, 20-25 June, 7pp.

Publisher

© IEEE

Version

VoR (Version of Record)

Publication date

2010

Notes

This is a conference paper [© IEEE]. It is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

ISBN

9781424458905

Language

en

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