Loughborough Dr Jon Petzing copy v2.pdf (3.02 MB)
Robust intelligent metrology
conference contribution
posted on 2014-08-14, 13:55 authored by Jon PetzingJon Petzing, Mitul Tailor, Peter KinnellRobust Intelligent Metrology considers how to maintain,
develop, streamline and apply core metrological principles
within rapidly evolving measurement scenarios and
environments. The aim is to deliver metrology laboratory
quality measurements and data confidence, but with
equipment integrated into operating High Value
Manufacturing cells. Key challenges are to understand;
transducer / surface interactions, data processing and
integrity, in-cell calibration / traceability. The end result is
to provide engineers with quicker, better data.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Published in
Royal Academy of Engineering Soiree and Exhibition RAE Summer Soiree and Exhibition: Manufacturing - at the heart of the nationPages
21 - 21 (1)Citation
PETZING, J.N., TAILOR, M. and KINNELL, P., 2014. Robust intelligent metrology. IN: Williams, R (ed). Royal Academy of Engineering Soiree and Exhibition 2014: Manufacturing - at the heart of the nation, 19th June 2014, The MTC, Coventry, pp.21.Publisher
Royal Academy of EngineeringVersion
- AM (Accepted Manuscript)
Publication date
2014Notes
This is a conference contribution.Language
- en