Robust intelligent metrology
conference contributionposted on 14.08.2014, 13:55 by Jon PetzingJon Petzing, Mitul Tailor, Peter Kinnell
Robust Intelligent Metrology considers how to maintain, develop, streamline and apply core metrological principles within rapidly evolving measurement scenarios and environments. The aim is to deliver metrology laboratory quality measurements and data confidence, but with equipment integrated into operating High Value Manufacturing cells. Key challenges are to understand; transducer / surface interactions, data processing and integrity, in-cell calibration / traceability. The end result is to provide engineers with quicker, better data.
- Mechanical, Electrical and Manufacturing Engineering