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Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry

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conference contribution
posted on 2022-06-07, 13:33 authored by Russ CoggraveRuss Coggrave, Pablo RuizPablo Ruiz, Christos Pallikarakis, Jonathan Huntley, H Du, M Banakar, X Yan, DT Tran, CG Littlejohns

A chip-scale solid-state wavelength measuring device based on a silicon photonics platform is presented. It has no moving parts and allows single-shot wavelength measurement with high precision over a nominal bandwidth of 40 nm in the O-band. The wavemeter design is based on multimode interferometer (MMI) couplers and a multi-band Mach–Zehnder interferometer (MZI) structure with exponentially increasing optical path differences and in-phase quadrature detection. The design of the MMI couplers is supported by simulations using the Finite-Difference Time-Domain (FDTD) method. The design, experimental evaluation, and calibration of the device are discussed. Observed performance indicates a spectral support of 38.069 nm (i.e., frequency bandwidth 6.608 THz), with a resolution of 8.3 pm (1σ), corresponding to 1 part in 4,587. This wavelength meter approach has emerged from a need in absolute distance measurements using frequency scanning interferometry, where knowledge of the instantaneous wavelength of a tunable laser is required to relate signal frequency with target range. We also present an adaptive delay line on a chip, demonstrate its use for range measurements, and suggest how the wavelength meter could evolve for real-time applications.


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  • Mechanical, Electrical and Manufacturing Engineering

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Proceedings of SPIE




SPIE Photonics Europe 2022




  • VoR (Version of Record)

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© Society of Photo-Optical Instrumentation Engineers (SPIE)

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Copyright 2022 Society of Photo‑Optical Instrumentation Engineers (SPIE). One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this publication for a fee or for commercial purposes, and modification of the contents of the publication are prohibited. C. R. Coggrave, P. D. Ruiz, C. A. Pallikarakis, J. M. Huntley, H. Du, M. Banakar, X. Yan, D. T. Tran, and C. G. Littlejohns "Single-shot wavelength meter on a photonic chip for absolute distance measurement using frequency scanning interferometry", Proc. SPIE 12137, Optics and Photonics for Advanced Dimensional Metrology II, 1213703 (20 May 2022); https://doi.org/10.1117/12.2626785

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  • en


Peter J. de Groot; Richard K. Leach; Pascal Picart


Strasbourg, France

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3rd April 2022 - 7th April 2022


Dr Russ Coggrave. Deposit date: 14 April 2022

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