Spatially and spectrally resolved electroluminescence measurement system for PV characterisation
conference contributionposted on 05.11.2014, 10:31 by Martin BlissMartin Bliss, Xiaofeng Wu, Karl Bedrich, Tom BettsTom Betts, Ralph Gottschalg
A system that combines the advantages of fast global electroluminescence (EL) measure-ments and highly detailed spectral EL meas-urements is presented. A Si camera-based EL system is used to measure the intensity of radi-ative recombination of the PV device spatially resolved over its full area. A monochromator-based system is then used to measure local-ised emission spectra at specific points of interest identified, as such as defects and cracks. The first measurement results of a mc-Si and an a-Si PV device show good agreement with reported behaviour of such devices and high-light the potential to distinguish between differ-ent defect types and reveal performance changes that would be missed using camera-based EL only.
This work has been supported by a joint UK-India initiative in solar energy through a joint project ‘Stability and Performance of Photovol-taics (STAPP)’ funded by Research Councils UK (RCUK) Energy Programme in UK (contract no: EP/H040331/1) and by Department of Sci-ence and Technology (DST) in India.
- Mechanical, Electrical and Manufacturing Engineering