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Download fileThe spectral variation effects on energy yield of optimized multi-junction solar cell
conference contribution
posted on 2011-03-09, 16:10 authored by Yingning Qiu, A.W. Clarke, Tom BettsTom Betts, Ralph GottschalgThe effect of spectral variations on the maximal
achievable efficiency of multi-junction solar cells is
investigated in this paper. The energy yield rather than
power rating are considered here. With the optimized band
gaps under STC the average and annual efficiency for
spectral irradiances measured at CREST in a wavelength
range from 310-1710nm is calculated. The material band
gap optimised for the measured average annual spectrum
and for STC spectrum are compared. The annual
efficiency and the annual yield of multi-junction solar cells
are calculated. It shows that optimum material band gaps
shift for a spectrum deviates from AM1.5 which indicates
that the spectral effects should be taken into account to
optimize multi-junction solar cell structure and system
design. The energy generated in Loughborough is
calculated for one year and it is shown that the
performance ratio of multi-junction solar cells optimized
under realistic condition is significantly reduced.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Research Unit
- Centre for Renewable Energy Systems Technology (CREST)
Citation
QIU, Y. ... et al, 2009. The spectral variation effects on energy yield of optimized multi-junction solar cell. IN: 34th IEEE Photovoltaic Specialists Conference (PVSC) 2009, Philadelphia, USA, 7th-12th June, pp. 000897-000902.Publisher
© IEEEVersion
- VoR (Version of Record)
Publication date
2009Notes
This conference paper [© IEEE] is also available at: http://dx.doi.org/10.1109/PVSC.2009.5411143. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISBN
9781424429493ISSN
0160-8371Publisher version
Language
- en