Tomographic imaging of all orthogonal components of the displacement field in weakly scattering materials using wavelength scanning interferometry
conference contributionposted on 28.01.2014, 14:23 by Pablo Ruiz, Semanti Chakraborty
This paper presents a wavelength scanning interferometry system which provides displacement fields inside the volume of semi-transparent scattering materials with high spatial resolution and threedimensional displacement sensitivity. This technique can be viewed as frequency multiplexed sweptsource OCT in which different channels carry information for specific displacement sensitivities.
- Mechanical, Electrical and Manufacturing Engineering