J3We0 9 2.pdf (235.95 kB)
Download file

Uncertainty in energy yield estimation based on C-Si module roundrobin results.

Download (235.95 kB)
conference contribution
posted on 10.06.2015, 10:49 by Blagovest Mihaylov, Jake BowersJake Bowers, Tom BettsTom Betts, Ralph Gottschalg, T. Krametz, R. Leidl, K.A. Berger, Shokufeh Zamini, N.J.J. Dekker, G. Graditi, F. Roca, M. Pellegrino, G. Flaminio, P. Pugliatti, A. Di Stefano, F. Aleo, G. Gigliucci, W. Ferrara, G. Razongles, J. Merten, A. Pozza, A. Santamaria Lancia, S. Hoffmann, M. Koehl, A. Gerber, J. Noll, F. Paletta, Gabi Friesen, Sebastian Dittmann
Results of the European FP7 Sophia project roundrobin of c-Si module power measurements at STC and low irradiance and temperature coefficients were used to calculate annual energy yield at four sites. The deviation in the estimates solely due to the different measurement results is reported, neglecting the uncertainty in the meteorological data and losses unrelated to the performed measurements. While minimising the deviation in Pmax measurements remains the key challenge, the low irradiance and temperature coefficient contributions are shown to be significant. Propagating the measurement deviation in c-Si module measurements would suggest that expanded uncertainty in energy yield due to module characterization alone can be as high as ±3-4%.


B. Mihaylov would like to acknowledge his funding through the RCUK Supergen project ‘Supersolar’ [grant no: EP/J017361/1]. This work has been funded by the European FP7 SOPHIA project, grant number: 262533.



  • Mechanical, Electrical and Manufacturing Engineering

Research Unit

  • Centre for Renewable Energy Systems Technology (CREST)

Published in

6th World Conference on Photovoltaic Energy Conversion


MIHAYLOV, B.V. ... et al, 2014. Uncertainty in energy yield estimation based on C-Si module roundrobin results. Presented at : The 6th World Conference on Photovoltaic Energy Conversion, 23rd-27th November 2014, Kyoto, Japan.


Institute of Electrical and Electronics Engineers, Japan Society of Applied Physics and IEEE Electron Devices Society / © IEEE


AM (Accepted Manuscript)

Publication date



© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.





Usage metrics