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Event-tree analysis using binary decision diagrams

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journal contribution
posted on 23.09.2008 by J.D. Andrews, Sarah J. Dunnett
This paper is concerned with ETA (event-tree analysis) where the branch point event causes are defined using fault trees. Attention is on the nontrivial situation where there are dependencies amongst the branch point events. The dependencies are due to component-failures in more than one of the fault trees. In these situations the analysis methods based on traditional FTA (fault-tree analysis) are inaccurate & inefficient. The inaccuracies are not consistent across the outcome events. If frequency predictions calculated in this way are then used in a risk assessment then the relative riskswould be distorted and could lead to resources being used inappropriately to reduce the overall risk. A new approach using BDD (binary decision diagram) is described which addresses these deficiencies.

History

School

  • Aeronautical, Automotive, Chemical and Materials Engineering

Department

  • Aeronautical and Automotive Engineering

Citation

ANDREWS, J.D. and DUNNETT, S.J., 2000. Event-tree analysis using binary decision diagrams. IEEE Transactions on Reliability, 49 (2), pp 230-239 [DOI: 10.1109/24.877343]

Publisher

© IEEE

Publication date

2000

Notes

This article was published in the journal IEEE Transactions on Reliability [© IEEE] and is also available at: http://ieeexplore.ieee.org/servlet/opac?punumber=24 Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.

ISSN

0018-9529

Language

en

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