2010-Hewett-PhysRevB.82.212404.pdf (232.51 kB)

Geometrically enhanced extraordinary magnetoresistance in semiconductor-metal hybrids

Download (232.51 kB)
journal contribution
posted on 18.07.2013, 10:58 by Thomas H. Hewett, Feodor Kusmartsev
Extraordinary magnetoresistance (EMR) arises in hybrid systems consisting of semiconducting material with an embedded metallic inclusion. We have investigated such systems with the use of finite-element modeling, with our results showing good agreement to existing experimental data. We show that this effect can be dramatically enhanced by over four orders of magnitude as a result of altering the geometry of the conducting region. The significance of this result lies in its potential application to EMR magnetic field sensors utilizing more familiar semiconducting materials with nonoptimum material parameters, such as silicon. Our model has been extended further with a geometry based on the microstructure of the silver chalcogenides, consisting of a randomly sized and positioned metallic network with interspersed droplets. This model has shown a large and quasilinear magnetoresistance analogous to experimental findings.

History

School

  • Science

Department

  • Physics

Citation

HEWETT, T.H. and KUSMARTSEV, F.V., 2010. Geometrically enhanced extraordinary magnetoresistance in semiconductor-metal hybrids. Physical Review B, 82 (212404), 4pp.

Publisher

© The American Physical Society

Version

VoR (Version of Record)

Publication date

2010

ISSN

1098-0121

Language

en

Exports

Logo branding

Keywords

Exports