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Multiscale microstructures and microstructural effects on the reliability of microbumps in three-dimensional integration

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posted on 16.08.2017, 11:08 by Zhiheng Huang, Hua Xiong, Zhiyong Wu, Paul Conway, Frank Altmann
The dimensions of microbumps in three-dimensional integration reach microscopic scales and thus necessitate a study of the multiscale microstructures in microbumps. Here, we present simulated mesoscale and atomic-scale microstructures of microbumps using phase field and phase field crystal models. Coupled microstructure, mechanical stress, and electromigration modeling was performed to highlight the microstructural effects on the reliability of microbumps. The results suggest that the size and geometry of microbumps can influence both the mesoscale and atomic-scale microstructural formation during solidification. An external stress imposed on the microbump can cause ordered phase growth along the boundaries of the microbump. Mesoscale microstructures formed in the microbumps from solidification, solid state phase separation, and coarsening processes suggest that the microstructures in smaller microbumps are more heterogeneous. Due to the differences in microstructures, the von Mises stress distributions in microbumps of different sizes and geometries vary. In addition, a combined effect resulting from the connectivity of the phase morphology and the amount of interface present in the mesoscale microstructure can influence the electromigration reliability of microbumps.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

Materials

Volume

6

Issue

10

Pages

4707 - 4736

Citation

HUANG, Z., 2013. Multiscale microstructures and microstructural effects on the reliability of microbumps in three-dimensional integration. Materials, 6 (10), pp.4707-4736

Publisher

MDPI (© the authors)

Version

VoR (Version of Record)

Publisher statement

This work is made available according to the conditions of the Creative Commons Attribution 3.0 Unported (CC BY 3.0) licence. Full details of this licence are available at: http://creativecommons.org/licenses/by/3.0/

Publication date

2013

Notes

This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution license (http://creativecommons.org/licenses/by/3.0/).

eISSN

1996-1944

Language

en

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