MM2017_NbO2EBIC_Final.pdf (301.37 kB)

STEM EBIC mapping of the metal-insulator transition in thin-film NbO2

Download (301.37 kB)
journal contribution
posted on 11.10.2017, 09:59 by William A. Hubbard, Toyanath Joshi, Matthew Mecklenburg, Brian Zutter, Pavel Borisov, David Lederman, B.C. Regan
STEM EBIC mapping of the metal-insulator transition in thin-film NbO2

History

School

  • Science

Department

  • Physics

Published in

Microscopy and Microanalysis

Volume

23

Issue

S1

Pages

1428 - 1429

Citation

HUBBARD, W.A. ... et al, 2017. STEM EBIC mapping of the metal-insulator transition in thin-film NbO2. Microscopy and Microanalysis, 23 (S1), pp. 1428-1429.

Publisher

Cambridge University Press © Microscopy Society of America

Version

AM (Accepted Manuscript)

Publication date

2017

Notes

This article has been published in a revised form in Microscopy and Microanalysis https://doi.org/10.1017/S1431927617007802. This version is free to view and download for private research and study only. Not for re-distribution, re-sale or use in derivative works. © copyright holder.

ISSN

1431-9276

eISSN

1435-8115

Language

en

Exports

Logo branding

Keywords

Exports