Single-shot profilometry of rough surfaces using hyperspectral interferometry
journal contributionposted on 03.10.2013 by Taufiq Widjanarko, Jonathan Huntley, Pablo Ruiz
Any type of content formally published in an academic journal, usually following a peer-review process.
The combination of white light interferometry with hyperspectral imaging (“hyperspectral interferometry”) is a recently proposed technique for single-shot measurement of 3D surface profiles. We consider for the first time its application to speckled wavefronts from optically rough surfaces. The intensity versus wavenumber signal at each pixel provides unambiguous range information despite the speckle-induced random phase shifts. Experimental results with samples undergoing controlled rigid body translation demonstrate a measurement repeatability of 460 nm for a bandwidth of approximately 30 nm. Potential applications include roughness measurement and coordinate measurement machine probes where rapid data acquisition in noncooperative environments is essential.
- Mechanical, Electrical and Manufacturing Engineering