Spatially and spectrally resolved electroluminescence measurement system for photovoltaic characterisation
journal contributionposted on 08.06.2015 by Martin Bliss, Xiaofeng Wu, Karl Bedrich, Jake Bowers, Tom Betts, Ralph Gottschalg
Any type of content formally published in an academic journal, usually following a peer-review process.
A system that combines the advantages of fast global electroluminescence (EL) imaging and detailed spectrally resolved EL measurements is presented. A charge-coupled device camera-based EL imaging system is used to measure the intensity of radiative recombination of the photovoltaic (PV) device spatially resolved over its full area. A monochromator-based system is utilised to measure localised emission spectra at given points of interest. Measurements of multi-crystalline and amorphous silicon PV devices demonstrate the potential to investigate radiative defects and reveal performance variations and non-uniformities. This links inhomogeneities much closer to device physics than using camera-based EL only.
This work has been supported by a joint UK–India initiative in solar energy through a joint project ‘Stability and Performance of Photovoltaics (STAPP)’ funded by the Research Councils UK (RCUK) Energy Programme in UK [grant no: EP/H040331/] and by the Department of Science and Technology (DST) in India.
- Mechanical, Electrical and Manufacturing Engineering