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Thermal activation Eyring energy approach to characterise the dependence of nanoscale friction on the surface roughness

journal contribution
posted on 26.06.2020 by Jamal Umer, F Saleem, M Asim, M Usman, MS Kamran, K Alam, Mahdi Mohammad-Pour
Atomic Force Microscope (AFM) is used to characterise the frictional response of surfaces with varying roughness parameters in dry and in the presence of fully formulated lubricants. The surface roughness has shown to affect nanoscale friction. The characteristics involved the investigation of roughness, small-scale adhesive forces and nanoscale friction using AFM in lateral force mode. The fluid-cell Lateral Force Microscopy (LFM) results were used to model thermal activation Eyring energy components in conjunction with the relevant continuum contact mechanics model. The paper shows that a combination of LFM, for dry and fluid-cell LFM and thermal activation Eyring energy barrier approach is a useful tool to explain the effect of surface roughness on nanoscale friction.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

Tribology International

Volume

151

Publisher

Elsevier

Version

AM (Accepted Manuscript)

Rights holder

© Elsevier Ltd

Publisher statement

This paper was accepted for publication in the journal Tribology International and the definitive published version is available at https://doi.org/10.1016/j.triboint.2020.106532.

Acceptance date

25/06/2020

Publication date

2020-07-07

Copyright date

2020

ISSN

0301-679X

Language

en

Depositor

Dr Mahdi Mohammad Pour. Deposit date: 26 June 2020

Article number

106532

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