Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure.pdf (1.89 MB)

Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure

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journal contribution
posted on 13.11.2015 by Nick Goffin, Fabiana Lisco, Alessandro Simeone, Gianfranco Claudio, John Tyrer, Elliot Woolley
Characterisation of Cadmium Telluride (CdTe) thin films commonly requires the use of invasive techniques for the identification of their structural growth and the detection of defects which occur during the deposition process. Structural growth and the presence of defects can affect the performance of the final device. A non-invasive inspection system for CdTe films has been developed to identify the structural properties of this material, comparing two different deposition techniques, Close Space Sublimation (CSS) and Magnetron Sputtering (MS). The proposed system utilises a 1 μm diode laser which passes through the CdTe layer, originating detectable diffraction patterns, which are characterised using image processing techniques and assessed using a neural network-based cognitive decision-making support system. Results are found to be consistent with the conventional microscopic techniques (SEM and TEM) used to analyse morphological and structural properties of thin-film CdTe solar cells.

Funding

This research has been funded by the Engineering and Physical Sciences Research Council (EPSRC) in the UK, with project number EP/M014088/1,

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

CIRPe 2015

Volume

37

Pages

101 - 106 (6)

Citation

GOFFIN, N.J. ... et al., 2015. Use of laser beam diffraction for non-invasive characterisation of CdTe thin film growth structure. Procedia CIRP 37, pp. 101-106.

Publisher

© 2015 The Authors. Published by Elsevier

Version

VoR (Version of Record)

Publisher statement

This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/

Publication date

2015

Notes

This is an Open Access Article. It is published by Elsevier under the Creative Commons Attribution 4.0 Unported Licence (CC BY). Full details of this licence are available at: http://creativecommons.org/licenses/by/4.0/ The paper was also presented at CIRPe 2015 - Understanding the life cycle implications of manufacturing, 29th Sept- 1st Oct, 2015.

ISSN

2212-8271

Language

en

Location

Online

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