Interferometer2 Roman et al v13 4.pdf (1.37 MB)
Analysis of mutually incoherent symmetrical illumination for electronic speckle pattern shearing interferometry
journal contribution
posted on 2008-09-18, 08:40 authored by Juan F. Roman, Vicente Moreno, Jon PetzingJon Petzing, John TyrerA speckle shearing interferometer has been designed using symmetrical mutually
incoherent illumination, in an effort to provide measurements of in-plane strain.
An analysis of the sensitivity to displacement and strain of this interferometer is
presented, together with analysis of the optical phase extraction of the resultant
fringe pattern. This interferometer is an improvement on previous designs as it
provides information on the in-plane strain separated from components of the
displacement. Experimental results provide qualitative data in the form of fringe
patterns in support of the theoretical analysis.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Citation
ROMAN, J.F. ... et al, 2006. Analysis of mutually incoherent symmetrical illumination for electronic speckle pattern shearing interferometry. Journal of Modern Optics, 53 (11), pp. 1541–1559 [DOI: 10.1080/09500340600578047]Publisher
© Taylor & FrancisPublication date
2006Notes
This article was published in the journal, Journal of Modern Optics, and the definitive version is available at: http://www.tandf.co.uk/journals/titles/09500340.aspISSN
0950-0340eISSN
1362-3044Language
- en