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Analysis of mutually incoherent symmetrical illumination for electronic speckle pattern shearing interferometry

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journal contribution
posted on 18.09.2008, 08:40 authored by Juan F. Roman, Vicente Moreno, Jon PetzingJon Petzing, John TyrerJohn Tyrer
A speckle shearing interferometer has been designed using symmetrical mutually incoherent illumination, in an effort to provide measurements of in-plane strain. An analysis of the sensitivity to displacement and strain of this interferometer is presented, together with analysis of the optical phase extraction of the resultant fringe pattern. This interferometer is an improvement on previous designs as it provides information on the in-plane strain separated from components of the displacement. Experimental results provide qualitative data in the form of fringe patterns in support of the theoretical analysis.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Citation

ROMAN, J.F. ... et al, 2006. Analysis of mutually incoherent symmetrical illumination for electronic speckle pattern shearing interferometry. Journal of Modern Optics, 53 (11), pp. 1541–1559 [DOI: 10.1080/09500340600578047]

Publisher

© Taylor & Francis

Publication date

2006

Notes

This article was published in the journal, Journal of Modern Optics, and the definitive version is available at: http://www.tandf.co.uk/journals/titles/09500340.asp

ISSN

0950-0340

eISSN

1362-3044

Language

en