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Assessment of radiation-induced soft errors on lightweight cryptography algorithms running on a resource-constrained device

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journal contribution
posted on 2023-06-26, 10:11 authored by Jonas Gava, Nicolas Moura, Joaquim Lucena, Vinicius Rocha, Rafael Garibotti, Ney Calazans, Sergio Cuenca-Asensi, Rodrigo Possamai Bastos, Ricardo Reis, Luciano OstLuciano Ost
Most safety-critical edge-computing devices rely on lightweight cryptography (LWC) algorithms to provide security at minimum power and performance overhead. LWC algorithms are traditionally embedded as a hardware component, but with the advance of the Internet of Things (IoT), emerging firmware is more likely to support cryptography algorithms to comply with different security levels and industry-standards. This is the first work to present the soft error assessment of five cryptography algorithms executing in a low-power microprocessor running under neutron radiation, considering electronic code book (ECB) and counter (CTR) mode of operation implementations. Results obtained from two neutron radiation tests suggest that: (i) the NOEKEON algorithm gives the best relative soft error reliability, performance, power efficiency and memory footprint utilisation trade-offs between the five algorithms considering both ECB and CTR implementations, and (ii) cryptography solutions based on the counter mode of operation present better FIT rate for silent data corruption (SDC) and crash w.r.t. ECB implementations.

Funding

CAPES; CNPq (grants 317087/2021- 5 and 407477/2022-5)

FAPERGS (grant no. 22/2551-0000570-5)

MultiRad (PAI project funded by Région Auvergne-Rhône-Alpes)

IRT Nanoelec (ANR-10-AIRT-05 project funded by French PIA)

UGA/LPSC/GENESIS platform

PID2019-106455GB-C22 (funded by the Spanish Ministry of Science and Innovation)

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

IEEE Transactions on Nuclear Science

Volume

70

Issue

8

Pages

1805-1813

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Version

  • AM (Accepted Manuscript)

Rights holder

© IEEE

Publisher statement

© 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.

Acceptance date

2023-03-01

Publication date

2023-03-06

Copyright date

2023

ISSN

0018-9499

eISSN

1558-1578

Language

  • en

Depositor

Dr Luciano Ost. Deposit date: 21 June 2023

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