posted on 2020-01-09, 14:13authored byChih-Kuo Lee, Shiyu Zhang, Syed Bukhari, Darren Cadman, J. C. Vardaxoglou, William WhittowWilliam Whittow
This paper describes a novel method of characterizing complex permittivity using a
complementary frequency selective surface (CFSS). The CFSS provides a passband behavior and the change
in the passband when a material under test (MUT) is placed adjacent to the CFSS has been used for retrieving
of the complex permittivity of the MUT. The complex permittivity of the MUT are determined based on the
measured bandpass resonant frequency and insertion loss of the CFSS with the MUT. This is an amplitudeonly method where phase measurements are not required. This technique offers a convenient, fast, low-cost
and nondestructive measurement that is not restricted by the sample size or shape
Funding
National Defense University, Taiwan
EPRSC under Grant EP/N010493/1 through Synthesizing 3D Metamaterials for RF, Microwave and THz Applications (SYMETA)
EPSRC under Grant EP/S030301/1 through Anisotropic Microwave/Terahertz Metamaterials for Satellite Applications (ANISAT)
History
School
Mechanical, Electrical and Manufacturing Engineering
Published in
IEEE Access
Volume
8
Pages
7628 - 7640
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
This is an Open Access Article. It is published by IEEE under the Creative Commons Attribution 4.0 Unported Licence (CC BY). Full details of this licence are available at: http://creativecommons.org/licenses/by/4.0/