posted on 2010-02-11, 10:22authored byPablo D. Ruiz, Yanzhou Zhou, Jonathan M. Huntley, Ricky D. Wildman
We describe a technique for measuring depth-resolved displacement fields within a 3-dimensional (3-D) scattering medium based on wavelength scanning interferometry. Sequences of 2-dimensional interferograms are recorded whilst the wavelength of the laser is tuned at constant rate. Fourier transformation of the resulting 3-D intensity distribution along the time axis reconstructs the scattering potential within the medium, and changes in the 3-D phase distribution measured between two separate scans provides one component of the 3-D displacement field. The technique is illustrated with a proof-of-principle experiment involving two independently controlled reflecting surfaces. Advantages over the corresponding method based on low coherence interferometry include a depth range unlimited by mechanical scanning devices, and immunity from fringe contrast reduction when imaging through dispersive media.
History
School
Mechanical, Electrical and Manufacturing Engineering
Citation
RUIZ, P.D. ... et al, 2004. Depth-resolved whole-field displacement measurement using wavelength scanning interferometry. Journal of Optics A: Pure and Applied Optics, 6 (7), pp. 679-683.