LUIR_JOpA-V6-P679-(2004).pdf (261.61 kB)

Depth-resolved whole-field displacement measurement using wavelength scanning interferometry

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journal contribution
posted on 11.02.2010, 10:22 by Pablo D. Ruiz, Yanzhou Zhou, Jonathan M. Huntley, Ricky D. Wildman
We describe a technique for measuring depth-resolved displacement fields within a 3-dimensional (3-D) scattering medium based on wavelength scanning interferometry. Sequences of 2-dimensional interferograms are recorded whilst the wavelength of the laser is tuned at constant rate. Fourier transformation of the resulting 3-D intensity distribution along the time axis reconstructs the scattering potential within the medium, and changes in the 3-D phase distribution measured between two separate scans provides one component of the 3-D displacement field. The technique is illustrated with a proof-of-principle experiment involving two independently controlled reflecting surfaces. Advantages over the corresponding method based on low coherence interferometry include a depth range unlimited by mechanical scanning devices, and immunity from fringe contrast reduction when imaging through dispersive media.

History

School

  • Mechanical, Electrical and Manufacturing Engineering

Citation

RUIZ, P.D. ... et al, 2004. Depth-resolved whole-field displacement measurement using wavelength scanning interferometry. Journal of Optics A: Pure and Applied Optics, 6 (7), pp. 679-683.

Publisher

© Institute of Physics

Version

AM (Accepted Manuscript)

Publication date

2004

Notes

This article was published in the Journal of Optics A: Pure and Applied Optics [© IOP] and the definitive version can be found at: http://dx.doi.org/10.1088/1464-4258/6/7/004

ISSN

1464-4258

Language

en

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