Depth-resolved whole-field displacement measurement using wavelength scanning interferometry
journal contributionposted on 2010-02-11, 10:22 authored by Pablo D. Ruiz, Yanzhou Zhou, Jonathan M. Huntley, Ricky D. Wildman
We describe a technique for measuring depth-resolved displacement fields within a 3-dimensional (3-D) scattering medium based on wavelength scanning interferometry. Sequences of 2-dimensional interferograms are recorded whilst the wavelength of the laser is tuned at constant rate. Fourier transformation of the resulting 3-D intensity distribution along the time axis reconstructs the scattering potential within the medium, and changes in the 3-D phase distribution measured between two separate scans provides one component of the 3-D displacement field. The technique is illustrated with a proof-of-principle experiment involving two independently controlled reflecting surfaces. Advantages over the corresponding method based on low coherence interferometry include a depth range unlimited by mechanical scanning devices, and immunity from fringe contrast reduction when imaging through dispersive media.
- Mechanical, Electrical and Manufacturing Engineering