Design of Alvarez beam scanning reflectarray with inversely proportional focal length
In this letter, a beam scanning Alvarez reflectarray (RA) metasurface with its focal length ( F ) inversely proportional to the phase distribution on the Alvarez RA aperture is presented for ±45 o beam scanning coverage and less than 3-dB gain loss. The beam scanning mechanism is based on mechanically tilting the Alvarez RA panel to the desired direction to steer the beam. Compared to a conventional RA where F is directly proportional to the parabolic phase distribution, the proposed Alvarez RA shows a wider 1-dB and 3-dB gain bandwidth, higher aperture efficiency (AE ) , and wider scanning range with less than 3-dB gain loss. The proposed RA has adopted an Alvarez phase distribution which is a summation of two shifted cubic phase profiles. Pancharatnam- Berry (PB) meta-atoms of sub-wavelength periodicity were utilized to provide the 360 o phase range and to enhance the bandwidth of the RA. An Alvarez RA consisting of 38 × 38 PB meta-atoms has been designed, fabricated, and tested for ±45 o beam scan coverage with less than 3-dB gain loss. The simulated and measured results show that the gain of the proposed Alvarez RA metasurface is 29.1 dBi at 19.5 GHz, which corresponds to an AE of 44.2%. The 3-dB gain variation of the Alvarez RA is from 15 GHz to 23.4 GHz, which corresponds to a 3-dB gain bandwidth of 43.7%. The 1-dB gain bandwidth was 27.8% from 17.3 GHz to 22.9 GHz.
Funding
State Key Laboratory of Millimeter waves, Southeast University, China (Grant Number: K202317)
Newton Fellowship (Grant Number: NIF\R1\222093) by The Royal Society, UK
Anisotropic Microwave/Terahertz Metamaterials for Satellite Applications (ANISAT)
Engineering and Physical Sciences Research Council
Find out more...History
School
- Mechanical, Electrical and Manufacturing Engineering
Published in
IEEE Antennas and Wireless Propagation LettersVolume
22Issue
6Pages
1416 - 1420Publisher
Institute of Electrical and Electronics Engineers (IEEE)Version
- AM (Accepted Manuscript)
Rights holder
© IEEEPublisher statement
© 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Acceptance date
2023-02-07Publication date
2023-02-09Copyright date
2023ISSN
1536-1225eISSN
1548-5757Publisher version
Language
- en