DNLE_journal.pdf (1.88 MB)
Download fileDynamic node lifetime estimation for wireless sensor networks
journal contribution
posted on 2017-02-01, 14:08 authored by Wilawan Rukpakavong, Lin GuanLin Guan, Iain PhillipsIain PhillipsWireless sensor networks (WSNs) consist of a large number of nodes each with limited battery power. As networks of these nodes are usually deployed unattended, network lifetime becomes an important concern. This paper proposes a novel, feasible, dynamic approach for node lifetime estimation that works for both static and dynamic loads. It covers several factors that have an impact on node lifetime, including battery type, model, brand, self-discharge, discharge rate, age, and temperature. The feasibility of the proposed scheme is evaluated by using the real testbed experiments with two wireless sensor platforms: Mica2 and N740 NanoSensor, two operating systems: TinyOS and Contiki, and different brands of alkaline and nickel-metal-hydride batteries. The deviation of the proposed estimation is in the range of -3.5% -2.5%. Three major contributions are presented in this paper: (1) the impact factors on node lifetime; (2) lifetime equations for any starting voltage, ageing, charge cycles, and temperatures; and (3) the dynamic node lifetime estimation technique, which is proposed and implemented on real hardware and software platforms in WSNs.
History
School
- Science
Department
- Computer Science
Published in
IEEE Sensors JournalVolume
14Issue
5Pages
1370 - 1379Citation
RUKPAKAVONG, W., GUAN, L. and PHILLIPS, I., 2014. Dynamic node lifetime estimation for wireless sensor networks. IEEE Sensors Journal, 14 (5), pp.1370-1379.Publisher
© IEEEVersion
- AM (Accepted Manuscript)
Publisher statement
This work is made available according to the conditions of the Creative Commons Attribution-NonCommercial-NoDerivatives 4.0 International (CC BY-NC-ND 4.0) licence. Full details of this licence are available at: https://creativecommons.org/licenses/by-nc-nd/4.0/Acceptance date
2013-12-01Publication date
2013-12-18Notes
© 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other users, including reprinting/ republishing this material for advertising or promotional purposes, creating new collective works for resale or redistribution to servers or lists, or reuse of any copyrighted components of this work in other works.ISSN
1530-437XeISSN
1558-1748Publisher version
Language
- en