Effect of heavy inert ion strikes on cell density-dependent profile variation and distortion during the etching process for high-aspect ratio features

Vertical scaling technique faces a physical limitation in 3D NAND device fabrication, even assuming superior etching technology. Another promising scaling technique to increase the storage density is lateral scaling, which increases the number of holes between slit and slit from four to nine and above. However, unpredictable small critical dimension, feature-to-feature variation, and distortion occur. To elucidate the profile deteriorations induced by the lateral scaling, we analyzed the effect of the angular etching yield dependency of the incident ion fluxes into a given feature using the multiscale technology computer-aided design methodology. As one of the inherent features of the gas, incident angle θ_max in which the sputtering yield achieves its maximum value is a crucial factor for analyzing and modeling etching profiles. Moreover, the impact of the heavy inert ion strikes on the unpreferred etching profiles was investigated. In this study, the synergy of lower energy ions, larger fluxes, and larger θ_max of heavy inert ions decrease the feature-to-feature variation, reducing hard mask distortion without the etch rate reduction.