Effect of seasonal spectral variations on performance of three different photovoltaic technologies in India
journal contributionposted on 18.03.2016, 11:09 by D.B. Magare, O.S. Sastry, Rajesh Gupta, Tom Betts, Ralph Gottschalg, A. Kumar, B. Bora, Y.K. Singh
The accuracy of outdoor performance of a photovoltaic (PV) array can be improved by considering the spectral effects. In this paper, the impact of seasonal spectral variations on the three different silicon PV technologies: single junction amorphous silicon (a-Si), Hetero-junction with Intrinsic Thin-layer (HIT) and multi crystalline silicon (mc-Si) has been presented first time in Indian environmental conditions. The spectral effect on HIT PV module technology has been presented first time along with the first simultaneous study of variation in spectral indicators by useful fraction (UF), average photon energy (APE) and spectral mismatch factor (MMF), based on monthly and seasonal data. The maximum observed variation in UF was 26.4, 8.2, 10.8 %, while in MMF, variation was up to 24.7, 7.6, 8.2 % for a-Si, HIT and mc-Si, respectively, and in APE variation was up to 15.3 %. Among all three technology modules, first time reported HIT technology showed the least variation while maximum variation was observed in a-Si technology. The observed spectral effect variations have been discussed on Performance Ratio and compared with reported results of other global sites. The value and trends of spectral parameters are important to understand the effect of spectral variation on different technology. This study is especially important in Indian subcontinent perspective because of the strong monsoon season, where observed variation in the spectrum-related parameter found to be highest among all the seasons.
This work has been supported by a joint India-UK initiative in solar energy through a joint project ‘Stability and Performance of Photovoltaic (STAPP)’ funded by Department of Science and Technology (DST) in India and Research Councils UK (RCUK) Energy Programme in UK (contract no: EP/H040331/1). The authors would like to thank AIST, Japan for installation of test bed.
- Mechanical, Electrical and Manufacturing Engineering