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Event-tree analysis using binary decision diagrams
journal contribution
posted on 2008-09-23, 11:47 authored by J.D. Andrews, Sarah J. DunnettThis paper is concerned with ETA (event-tree analysis)
where the branch point event causes are defined using fault
trees. Attention is on the nontrivial situation where there are dependencies
amongst the branch point events. The dependencies
are due to component-failures in more than one of the fault trees.
In these situations the analysis methods based on traditional FTA
(fault-tree analysis) are inaccurate & inefficient.
The inaccuracies are not consistent across the outcome events. If
frequency predictions calculated in this way are then used in a risk
assessment then the relative riskswould be distorted and could lead
to resources being used inappropriately to reduce the overall risk.
A new approach using BDD (binary decision diagram) is described
which addresses these deficiencies.
History
School
- Aeronautical, Automotive, Chemical and Materials Engineering
Department
- Aeronautical and Automotive Engineering
Citation
ANDREWS, J.D. and DUNNETT, S.J., 2000. Event-tree analysis using binary decision diagrams. IEEE Transactions on Reliability, 49 (2), pp 230-239 [DOI: 10.1109/24.877343]Publisher
© IEEEPublication date
2000Notes
This article was published in the journal IEEE Transactions on Reliability [© IEEE] and is also available at: http://ieeexplore.ieee.org/servlet/opac?punumber=24 Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISSN
0018-9529Language
- en