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Download fileExperimental study of relationship between interfacial electroadhesive force and applied voltage for different substrate materials
journal contribution
posted on 2017-02-17, 16:09 authored by Jianglong Guo, Thomas Bamber, Jon PetzingJon Petzing, Laura JusthamLaura Justham, Michael JacksonAn experimental investigation into the relationship between the interfacial electroadhesive force and applied voltage up to 20 kV has been presented. Normal electroadhesive forces have been obtained between a double-electrode electroadhesive pad and three optically flat and different substrate materials: glass, acrylic, and polycarbonate. The results have shown that not all substrate
materials are good for the generation of electroadhesive forces. Only 15.7 Pa has been obtained between the pad and the polycarbonate substrate under 20 kV, whereas 46.3 Pa and 123.4 Pa have been obtained on the acrylic and glass substrate, respectively. Based on the experimental data, empirical models, with an adjusted R-square value above 0.995 in all cases, have been obtained for the three substrates. However, it has not been possible to develop a general empirical model which is suitable for all substrates. This further indicates the need for a large quantity of experimental data to obtain robust empirical models for different substrate materials in order to reliably use electroadhesive technologies for material handling applications.
Funding
The authors acknowledge the support from the EPSRC Centre for Innovative Manufacturing in Intelligent Automation in undertaking this research work under Grant Reference No. EP/IO33467/1.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Published in
Applied Physics LettersVolume
110Issue
5Citation
GUO, J. ... et al, 2017. Experimental study of relationship between interfacial electroadhesive force and applied voltage for different substrate materials. Applied Physics Letters, 110 (5), 051602.Publisher
© Author(s). Published by the American Institute of PhysicsVersion
- VoR (Version of Record)
Publisher statement
This work is made available according to the conditions of the Creative Commons Attribution 4.0 International (CC BY 4.0) licence. Full details of this licence are available at: http://creativecommons.org/licenses/ by/4.0/Publication date
2017Notes
This is an Open Access Article. It is published by the American Institute of Physics under the Creative Commons Attribution Licence (CC BY). Full details of this licence are available at: http://creativecommons.org/licenses/by/4.0ISSN
0003-6951Publisher version
Language
- en