FSLog: adversarial margin for cross-system few-shot log anomaly detection
Log-based anomaly detection (LAD) is imperative to ensure both the reliability and security of software systems. Although many deep learning approaches have been designed to capture complex and diverse anomaly patterns from log files, they heavily rely on large-scale annotated data. However, collecting sufficient labeled data is impractical when a software system has just been deployed. In this paper, we propose a cross- system few-shot learning log-based anomaly detection approach, namely FSLog, to solve the label scarcity problem, which is the main challenge of recent LAD research. Specifically, we leverage a pre-trained model from source system to enrich feature representations so that data instances from target system can also be effectively represented. Further, we introduce a novel adversarial margin loss to enhance our feature distinguishability while preserving their generalizability. We evaluate the proposed FSLog on three publicly available datasets based on a standard few-shot learning setup protocol. Experimental results demonstrate that our method achieves the best performance in detecting abnormal logs when compared to state-of-the-art methods.
Funding
National Nature Science Foundation of China: T2350710232
Fundamental Research Funds for the Central Universities: DUT20GJ205
History
School
- Science
Department
- Computer Science
Published in
IEEE Transactions on Information Forensics and SecurityPublisher
Institute of Electrical and Electronics Engineers (IEEE)Version
- AM (Accepted Manuscript)
Rights holder
© IEEEPublisher statement
© 2024 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.Acceptance date
2024-08-26Copyright date
2024ISSN
1556-6013eISSN
1556-6021Publisher version
Language
- en