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Download fileFrequency range of stable dielectric-barrier discharges in atmospheric He and N2
journal contribution
posted on 2009-08-26, 13:26 authored by Xu-Tao Deng, Michael G. KongWhile there have been extensive studies of nonthermal
atmospheric dielectric-barrier discharges (DBD), many key facets
of their characteristics remain to be unraveled before their full
understanding is achieved. One of the missing pieces in our current
knowledge is the dependence of stable DBD production upon
temporal characteristics of the applied voltage such as excitation
frequency. In this contribution, we report a numerical investigation
of the frequency range for the generation of stable DBD and
that of likely mechanisms for disruption of DBD stability.We show
that when the excitation frequency is too low, an irreversibly large
mismatch of the rise-time occurs between the applied voltage and
the memory voltage. It is demonstrated that this mismatch results
in a rapid suppression of the gas voltage and as such, the generated
DBD is quenched prematurely. Also, it is shown that when the
excitation frequency is too high, most electrons produced in the
plasma bulk become trapped in the interelectrode gap and are unable
to reach the electrodes. As a result, the gas voltage increases
without being contained adequately by a sizeable memory voltage.
Again, this leads to premature plasma quenching. These observations
highlight the importance of the dynamic balance between the
applied voltage and the memory voltage in dielectric-barrier discharges.
We compare the above issues in both a helium DBD and
a nitrogen DBD and report that our findings of the two stability
disruption mechanisms are generic in different DBD systems.
History
School
- Mechanical, Electrical and Manufacturing Engineering
Citation
DENG, X.T. and KONG, M.G., 2004. Frequency range of stable dielectric-carrier discharges in atmospheric He and N2. IEEE Transactions on Plasma Science, 32(4), pt.3, pp.1709-1715.Publisher
© IEEEVersion
- VoR (Version of Record)
Publication date
2004Notes
This article was published in the journal, IEEE Transactions on Plasma Science [© 2004 IEEE] and is also available at: http://ieeexplore.ieee.org/ Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.ISSN
0093-3813Language
- en