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From light to displacement: a design framework for optimising spectral-domain low-coherence interferometric sensors for in situ measurement

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journal contribution
posted on 09.12.2020, 11:16 by Tom Hovell, Jon Petzing, Laura Justham, Peter Kinnell
Growing requirements for in-situ metrology during manufacturing has led to an increased interest in optical coherence tomography (OCT) configurations for industrial domains. This paper investigates the optimisation of spectral domain OCT hardware and signal processing for such implementations. A collation of the underlying theory of OCT configured LCI systems from disparate sources linking the journey from the light reflected from the object surface to the definition of the measurand is presented. This is portrayed in an applicable, comprehensible design framework through its application to profilometry measurements for optimising system performance.

Funding

In Jet Interferometry for Ultra Precise Electrolyte Jet Machining

Engineering and Physical Sciences Research Council

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EPSRC Fellowship in Manufacturing: Collaborative Metrology Systems for High Value Manufacturing

Engineering and Physical Sciences Research Council

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History

School

  • Mechanical, Electrical and Manufacturing Engineering

Published in

Applied Sciences

Volume

10

Issue

23

Publisher

MDPI AG

Version

VoR (Version of Record)

Rights holder

© The Authors

Publisher statement

This is an Open Access Article. It is published by MDPI under the Creative Commons Attribution 4.0 International Licence (CC BY 4.0). Full details of this licence are available at: https://creativecommons.org/licenses/by/4.0/

Acceptance date

26/11/2020

Publication date

2020-11-30

Copyright date

2020

ISSN

2076-3417

eISSN

2076-3417

Language

en

Depositor

Dr Jon Petzing. Deposit date: 26 November 2020

Article number

8590

Licence

Exports